At the heart of every measurement instrument, nanopositioning stages based on our patented slip-stick principle provide several degrees of freedom over several millimeters, with a sub-nm precision.
Scanning Probe Microscopes
for low temperature
attocube’s Scanning Probe Microscopes cover a wide range of dedicated research tools for nanoscale imaging within our microscope portfolio. Many of these instruments are based on well-established techniques in nanoscience, which have been adopted and optimized for low temperature and high magnetic field operation exclusively by attocube. Despite the additional complexity due to such extreme environments, we are striving to design our scanning probe microscopes (SPMs) so that the difference between room and low temperature operation fades away.
Our measurement options provide user-friendly instrumental platforms for the characterization of materials properties on the nanoscale via SPM such as magnetic force microscopy (MFM), piezo-response force microscopy (PFM), Kelvin Probe Force Microscopy (KPFM), conducting-tip AFM (c-AFM) or scanning Hall probe microscopy (SHPM), as well as for optical characterization of quantum objects via confocal microscopy (CFM) and Raman spectroscopy.
With a large number of installed systems, the key features of these instruments are proven performance, flexibility and ease of use. All systems have been standardized to offer cost- effective solutions, addressing the majority of experimental SPM requirements.
Our scanning probe microscopes also address the needs of experts in the various fields of applications due to the open signal architecture of our powerful and flexible ASC500 SPM controller. All in- and output signals are accessible via front panel BNCs, and can hence easily be monitored, stored and used for additional control loops or spectroscopies. Last but not least, our unique closed loop scan option allows for global sample navigation over the complete range of the microscope at cryogenic temperatures, and hence enables the retrieval of regions of interest very precisely.
Patented Positioning Technology
The clever mechanical design of our microscopes is complemented by versatile and powerful electronics, such as our renowned ASC500 scanning probe microscopy controller and the ASC400 confocal microscope controller.
Flexible Upgrade Options
Choose from a variety of upgrade options ranging from additional wiring (twisted pairs as well as flexible and semi-rigid coaxial wires), to closed loop upgrades for coarse positioners and scanners, as well as inspection optics for the microscopes, sample holders and a variety of additional accessories to adapt the instrument to your application.
Variable Temperatures & High Magnetic Fields
All of our instruments have been very carefully designed to meet the requirements of cryogenic environments and high magnetic fields by the choice of suitable materials and appropriate mechanical working principles.
Cantilever-based AFM for magnetic force microscopy and piezo-response force microscopy at cryogenic temperatures and in high magnetic fields.
Tuning-fork based AFM with shear-force detection for scanning gate microscopy at cryogenic temperatures and in high magnetic fields.
Combined atomic force and confocal microscope platform for optically detected magnetic resonance.
Scanning Hall Probe Microscope with down to 250 nm resolution for operation at cryogenic temperatures.