Surface Science
analysis of thin films & surfaces
Surfaces of materials or thin films hold a complete micro cosmos of physical properties that are hot topics of today's research. The type of measurements to analyze the surface structure of magnetic materials, superconductors, graphene and 2D materials range from atomic force microscopy (AFM) to magnetic force microscopy (MFM) and to transport measurements. In addition, intrinsic properties and electronic structure such as vortex formation, the properties of topological insulators, multiferroics, ferroelectrics and domain walls are analyzed using low temperature Raman and electrical transport techniques as well as low temperature scanning microwave impedance microscopy (LT-sMIM).
Research Fields
- magnetic material properties
- magnetic imaging
- superconductors & vortex imaging
- electronic structure of sample surfaces
- surface polariton mapping
- graphene & 2D materials
- superconductor and semiconductor physics
- topological insulators
- stress / strain mapping
- ferroelectrics, multiferroics & domain walls
Application Snippets
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