Surface Science
analysis of thin films & surfaces
Surfaces of materials or thin films hold a complete micro cosmos of physical properties that are hot topics of today's research. The type of measurements to analyze the surface structure of magnetic materials, superconductors, graphene and 2D materials range from atomic force microscopy (AFM) to magnetic force microscopy (MFM) and to transport measurements. In addition, intrinsic properties and electronic structure such as vortex formation, the properties of topological insulators, multiferroics, ferroelectrics and domain walls are analyzed using low temperature Raman and electrical transport techniques as well as low temperature scanning microwave impedance microscopy (LT-sMIM).
Research Fields
- magnetic material properties
- magnetic imaging
- superconductors & vortex imaging
- electronic structure of sample surfaces
- surface polariton mapping
- graphene & 2D materials
- superconductor and semiconductor physics
- topological insulators
- stress / strain mapping
- ferroelectrics, multiferroics & domain walls
Application Snippets
Combined Laser Beam Epitaxy and Low-Temperature STM using ANPx321 Positioners
Resonance Frequency of an ANSxy50 made of titanium
Near-Field Scanning Microwave Microscope at 30mK
Discovery of Intermediate State in the Metal-Insulator Transition
Ultimate Thermal Stability and Ultra-Low Drift
A new way to modulate exciton-complex emissions of TMDs
Measurements of field-driven transformation of a domain pattern
Quantized Conduction on Domain Walls of a Magnetic Topological Insulator
Quasi-2D Magnon identified via Magneto-Raman Spectroscopy
Local Conductivity Mapping and PFM on BFO Thin Film
Low Temperature Piezoresponse Force Microscopy on BiFeO
Piezo-Response Force Measurements on Ferroic Oxide Films
Dynamic Visualization of Nanoscale Vortex Motion using attoSTM in an attoLiquid3000
Low Temperature Surface Piezoelectricity in SrTiO3 using Piezo-Response Force Microscopy
Imaging fractional incompressible stripes in integer quantum Hall effect
Scanning Hall Probe Microscopy at 300 mK with ANP positioners
mK STM Image with Atomic Resolution
Piezo-Controlled Exfoliation of Graphene
HF-SPM using attocube nano-positioners in magnetic fields above 30 T
Conductive-Tip AFM Measurements on Ruthenium
Scanning Gate Microscopy at 300 mK
KPFM of Au-on-Pt Pattern
attoAFM/CFM in Toploading Insert
Tuning Fork based AFM measurements at cryogenic temperatures
Scanning Tunneling Spectroscopy and Vortex Imaging on NbSe2 with attoAFM III / STM I at 315 mK
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