
Surface Science
analysis of thin films & surfaces
Surfaces of materials or thin films hold a complete micro cosmos of physical properties that are hot topics of today's research. The type of measurements to analyze the surface structure of magnetic materials, superconductors, graphene and 2D materials range from atomic force microscopy (AFM) to magnetic force microscopy (MFM) and to transport measurements. In addition, intrinsic properties and electronic structure such as vortex formation, the properties of topological insulators, multiferroics, ferroelectrics and domain walls are analyzed using low temperature Raman and electrical transport techniques as well as low temperature scanning microwave impedance microscopy (LT-sMIM).
Research Fields
- magnetic material properties
- magnetic imaging
- superconductors & vortex imaging
- electronic structure of sample surfaces
- surface polariton mapping
- graphene & 2D materials
- superconductor and semiconductor physics
- topological insulators
- stress / strain mapping
- ferroelectrics, multiferroics & domain walls
Application Snippets

Combined Laser Beam Epitaxy and Low-Temperature STM using ANPx321 Positioners

Resonance Frequency of an ANSxy50 made of titanium

Near-Field Scanning Microwave Microscope at 30mK

Discovery of Intermediate State in the Metal-Insulator Transition

Ultimate Thermal Stability and Ultra-Low Drift

A new way to modulate exciton-complex emissions of TMDs

Measurements of field-driven transformation of a domain pattern

Quantized Conduction on Domain Walls of a Magnetic Topological Insulator

Quasi-2D Magnon identified via Magneto-Raman Spectroscopy

Local Conductivity Mapping and PFM on BFO Thin Film

Low Temperature Piezoresponse Force Microscopy on BiFeO

Piezo-Response Force Measurements on Ferroic Oxide Films

Dynamic Visualization of Nanoscale Vortex Motion using attoSTM in an attoLiquid3000

Low Temperature Surface Piezoelectricity in SrTiO3 using Piezo-Response Force Microscopy

Imaging fractional incompressible stripes in integer quantum Hall effect

Scanning Hall Probe Microscopy at 300 mK with ANP positioners

mK STM Image with Atomic Resolution

Piezo-Controlled Exfoliation of Graphene

HF-SPM using attocube nano-positioners in magnetic fields above 30 T

Conductive-Tip AFM Measurements on Ruthenium

Scanning Gate Microscopy at 300 mK

KPFM of Au-on-Pt Pattern

attoAFM/CFM in Toploading Insert

Tuning Fork based AFM measurements at cryogenic temperatures

Scanning Tunneling Spectroscopy and Vortex Imaging on NbSe2 with attoAFM III / STM I at 315 mK
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