characterization of material properties at low temperatures
Characterization of material properties at cryogenic or variable temperatures plays a vital role in experiments conducted within physics and materials science. The most common example is transport measurements, which characterize a specimen’s electrical response to an external excitation. Often, the application of high magnetic fields and their orientation with respect to the sample structure are of interest. In such cases, our double rotator module as well as the complete transport measurement solution are ideal probing tools. Other examples involve testing of actual devices at cryogenic temperatures either via their electrical properties with an electrical probe station, or of photonic integrated circuits with our photonic probe station.