Correlative nano-Raman

combines nano-IR and Raman spectroscopic imaging for complementary nanoscale vibrational analysis of surfaces

Correlative nano-Raman merges Raman and Photoluminescence with AFM and nano-IR imaging & spectroscopy. Combining AFM-based visible and IR techniques in a single instrument enables probing of both Raman- and IR-active modes with comparable nanoscale spatial resolution for effortless correlative analysis of vibrational, structural and electronic properties of a wide variety of samples. It further enables Tip-Enhanced optical measurements such as Tip-Enhanced Raman and s-SNOM (TERs).

Challenge

Correlative nano-Raman requires same-spot focusing and detection of both visible and mid-IR light onto the AFM tip while maintaining high collection efficiency required for tip-enhanced spectroscopic analysis. Further, multiple detection technologies are required in the same instrument.

Solution

neaSCOPE instruments utilize broadband reflective optics and a unique ultrahigh-NA (NA=0.7) side-illumination parabolic mirror objective to provide precise focusing and maximum collection of light in both visible and IR spectral ranges. Integration of multiple detection technologies (Raman/Photoluminescence, s-SNOM, nano-FTIR, AFM-IR) ensure top performance on all sample classes.

neaSCOPE correlative nano-Raman utilizes a proprietary ultrahigh-NA side-illumination parabolic mirror that can focus both IR and Visible beams onto the same sample area and collect inelastic and elastic scattering signals. Inelastic scattered light is guided to the Raman spectrometer using free-space coupling to minimize losses, while elastically scattered light and photothermal expansion are registered using neaSCOPE state-of-the-art nano-IR detection techniques (s-SNOM, nano-FTIR or tapping AFM-IR+) that provide maximum sensitivity and true nanoscale spatial resolution. Using the same focusing objective for all measurement modes with or without the AFM tip ensures minimum-effort correlation of various multichannel data and serves a perfect platform for realization of TERS and TEPL measurements (TERS and TEPL require special tips that provide strong resonant field enhancement and are not provided by attocube).

Technology Benefits

nano-FTIR and nano-Raman spectroscopy measured from the same spot for comprehensive vibrational analysis using both elastic and inelastic scattering.

Hyperspectral Raman imaging for complementary analysis of crystallinity, defects and strain on, e.g. on Graphene.

Correlative nano-analysis using nano-IR, photoluminescence and AFM of e.g. van der Waals heterostructures.

nano-Raman spectroscopy with subdiffractional resolution using the tip-enhanced approach for correlative nanoscale chemical and structural mapping. Obtained with standard nano-IR tip.

Unique nanoscale photoluminescence (nano-PL) mapping simultaneously with the sample topography; all in addition to the traditional micro-PL spectroscopy functionality.