Nanonis Mimea
your companion for efficient cryogenic SPM
control of temperature & magnetic field via Nanonis software
full integration and automation
closed-loop scanning
true distances and angles & easy retrieval of ROI
synchronized feedback loops & presets for jump start of scanning
advanced user-friendliness for advanced SPM
Among scanning probe microscopy (SPM) controllers, Nanonis Mimea has been the benchmark for years, just like attocube cryogenic equipment has been the benchmark for SPM and confocal microscopy at cryogenic temperatures. Now attocube and SPECS Zurich combine forces and bring to the market a novel edition of Nanonis Mimea controller which features integration with attocube cryostats and scanning microscopes, while inheriting all previous Nanonis functionalites, like for example the SafeTipTM feature.
The seamless integration between attocube and Nanonis equipment enables users to efficiently perform SPM even with challenging samples and/or measurement techniques. Users will especially benefit from automated closed-loop scanning (and positioning) which corrects from nonlinearities of piezoelectric elements and provides artefact-free scans, regardless of which scanning probe technique (e.g., MFM, KPFM, PFM, MIM, ct-AFM) is used.
Superb Control Features
exclusively developed for Nanonis Mimea attocube edition
Nanonis Mimea is known for its comprahensive control options that enable fine tuning of specific needs of each experiment. Moreover, the attocube edition of Nanonis Mimea offers novel features that enable truly superb control of SPM experiments for unique user experience and quick time-to-result.
Integrated B & T Control
full automation of your experiments
Integrated T & B Control
Nanonis Mimea attocube edition comes with integrated control of the sample temperature & magnetic field of the attocube cryostat via Nanonis software.
Moreover, this means automated calibration of the scanning range of attocube scanners at all temperatures from base temperature to room temperature.
Such automation enables the users faster time-to-result since they can focus on the science of their samples.
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Closed-Loop Scanning
true distances and angles + easy retrieval of ROI
Closed-Loop Scanning
Reliable scanning over tens of µm down to tens of nm is easily achieved with piezo scanners. However, they exhibit a nonlinear dependance of displacement on the applied voltage, which in turn results in errors like false representation of sample´s features (distances, angles, etc.) in scans, or unreliability in retrieving the region of interest (ROI) on the sample.
Closed-loop scanning corrects for such nonlinearities down to the nm-scale, owing to its ultra-sensitive interferometry-based feedback. In case of attocube microscopes, our patented IDS sensor (a fiber-based interferometer) measures the position and (re)adjusts it via the feedback to the scan controller Nanonis Mimea. While open loop scanning features time-triggered data acquisition, closed loop scanning features accurate position-based acquisition of data.
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Preset Scanning Parameters
jump start your SPM experiments
Preset Scanning Parameters
Nanonis Mimea attocube edition comes with presets of key scanning parameters for standard SPM techniques such as MFM, KPFM, ct-AFM and PFM. Moreover, the user manual contains instructions on how to adjust the scanning parameters when you change the temperature and the magnetic field. Thus you can jump start your experiments and you can focus on the physics of your sample rather than on the physics of your instrument. Of course, all parameters are freely adjustable at any time, so you do not have to abide to the presets.
CLOSESelected Measurement
MFM with tip-sample distance control
Drift-free MFM imaging enabled by capacitive distance control
The images show magnetic domain patterns in a Co–Dy multilayer sample acquired without (a) and with (b) the capacitive distance-control loop at a lift height of 30 nm. A sinusoidal modulation (2 V, 5 kHz) was applied between the tip and sample, and the resulting photodetector signal was demodulated at the second harmonic (2f) using the built-in lock-in module of the Nanonis controller. The in-phase demodulated signal, proportional to the tip–sample capacitance gradient, served as the input for a feedback loop that continuously compensated drift — stabilizing the tip height and ensuring consistent magnetic contrast throughout the scan.
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Specifications
| Size and Dimensions | |
|---|---|
| chassis | OC4 33 x 28 x 7 cm |
| RC5e 33 x 28 x 21 cm | |
| SC5 33 x 28 x 7 cm | |
| weight | SC5 4.2 kg |
| RC5e 8 kg | |
| OC4 3.7 kg | |
| Controller Hardware | |
| power supply | 100-240 V ±10%, 50/60 Hz ±5%, Fuses 200 V T4AH (RC5e), 100/120/230 V ±10%, 50/60 Hz ±5%, Fuses 250 V 2AT (SC5, OC4) |
| power consumption [W] | RC5e 85 W typ., 220W max. |
| SC5 35 W typ., 60W max. | |
| OC4 11 W typ., 25W max. | |
| connector | IEC inlet (3x) |
| RC5e computing and connectivity | |
| real-time processing | NI PXIe-8840 real-time system with Intel Corei5 CPU 2.7 GHz, 4 GB RAM |
| FPGA | NI PXIe-7976 |
| operating system | LabVIEW real-time OS |
| signal interfaces connectivity | 3x SC5 max., 2x SO5 max., 2x OC4 max. Total of max. 6 frontends |
| data transfer to host PC | 1 Gbit/s TCP/IP, 2 kS/s default, up to 20 kS/s, 1 MS/s x 8 channels for data streaming |
| Output Signals | |
| frequency range | DC - 40 kHz (SC5), 100 Hz - 5 MHz (OC4) |
| Detection | |
| measurement bandwidth | DC - 100 kHz (SC5), 100 Hz - 5 MHz (OC4) |
| Interfaces | |
| xy scan voltage output | (SC5) 2x BNC -10..+10 V, 20 bit (22 bit with hrDAC), 1 MS/s, 40 kHz, bipolar or unipolar, output limiter, tilt- and drift correction |
| z voltage output | (SC5) 1x -10..+10 V, 20 bit (22 bit with hrDAC), 1 MS/s, 40 kHz, bipolar or unipolar, output limiter, tilt- and drift correction |
| analog ADC inputs | (SC5) 8x BNC -10..+10 V, 18 bit, 1 MS/s, 100 kHz. Can be extended to up to 24 inputs |
| analog DAC outputs | (SC5) 8x BNC -10..+10 V, 20 bit (22 bit with hrDAC), 1 MS/s, 40 kHz (3 outputs used for xy and z). Can be extended to up to 48 outputs |
| high frequency section | (OC4) -10..+10 V, 14 bit, 40 MS/s, 5 MHz ADC and DAC. 16 bit amplitude resolution. Dual Option available. Sync output, TTL-phase-sync output |
| general purpose digital interface | 32 bidirectional 500 kHz TTL I/Os for communication and triggering. Pixel-, line-, frame sync available. 4x input and 4x output 200 MHz TTL I/Os for pulse counting and triggering |
| host computer interface | Ethernet 1 Gbit |
| auxiliary power outlet | +/-15 V (0.3 A) |
| Resolution | |
| frame view display modes | up to 7 frame views, 2 line views, generation of additional views with programming interface |
| frame view options | various fitting-, saving (.sxm), and scaling options |
| frame view selection tools | frame position, rotation, scaling, centering, zoom on the fly. Dedicated grid, subgrid and point modes |
| Scan Generation | |
| pixel clock [kHz] | 20 kHz for normal scan engine, 1 MHz for fast scan engine |
| resolution | up to 22 bits, depending on oversampling |
| features (scan) | global and local slope compensation |
| scan speed | 100 pm/s - 1.2 mm/s @ 30µm x 30µm (slow scan engine); 30 µm/s - 30 cm/s @ 30µm x 30µm (fast scan engine) |
| frame rate | max. 0.9 Hz @ 100 x 100 pixel (slow scan engine); 50 Hz @ 100 x 100 pixel (fast scan engine) |
| Signal Architecture | |
| number of internal signals | 128, access from all software modules and from multiple software modules |
| data rate | 20 KS/s, 1 MS/s, maximum oversampling automatically applied for a given data acquisition rate |
| max. simultaneously acquired signals at 20 kS/s | 24 + 24 for data logging |
| max. simultaneously acquired signals at 1 MS/s | 8 |
| experiments | multiple experiments can be performed in parallel without performance degradation |
| real-time operations | mathematical operations between signals are possible in real-time |
| units | real-world, calibrated SI-units throughout the software |
| data logging | continuous data logging with up to 100 M points per file and up to 24 channels at up to 20 kS/s |
| data display | multiple charts, graphs, oscilloscopes and spectrum analyzer |
| Sample Positioning | |
| sensor type | interferometric (IDS) or position triggered scanning |
| closed loop sensor range | 5 mm x 5 mm |
| closed loop scan resolution (steady state, 100 ms sample time) | down to 1 nm (usually limited by noise & vibration levels) |
| Z Controller | |
| operation | on the fly switching between controller modes and signals |
| z feedback | digital P/I, anti wind-up |
| z resolution | 18 bit, internal resolution of 32 bit |
| input control signal | any input or internal signal channel |
| features (z controller) | linear, absolute and logarithmic controllers, control on multiple signals (sum, subtraction multiplication, division), invertible polarity, P/I gain in physical units |
| safety | SafeTip functionality for tipcrash protection, triggered by any internal signal. Autorecovery options and autowithfraw including coase motion withdraw for minimzation of data losses and tip damage |
| Oscillation control | |
| lock-in signal processing | configurable filters, cut-off frequency between 1 mHz and 50 kHz (time constant), slope between 1. and 8. order |
| demodulators | four independent demodulators for multi-harmonics measurements |
| PLL parameter tuning | PerfectPLL for for automating tuning of PLL parameters according to oscillator parameters |
| resonance curve | frequency sweep with autofit-routine for phase slope, amplitude or phase curve, improves fit precision from UHV to liquid environment |
| Q-control | Q-factor reduction (to 0) or enhancement |
| signal analysis | 40 MS/s oscilloscope and FFT with up to 32k samples, Zoom FFT with filter compensation |
| Phase Locked Loop (PLL) | |
| features (PLL) | 2 P/I controllers (4 with dual-OC4) with graphical interface |
| frequency resolution [µHz] | < 1 nHz |
| dual PLL | dual PLL option for multi-excitation schemes. Inlcudes TrueDissipation algorithm and calibration for enhanced dissipation measurements |
| Q Control | |
| q feedback type | digital, phase controlled |
| efficiency of Q control | decrease or increase of Q by up to 100% |
| Spectral Performance | |
| spectroscopy modes | point/line/grid/subgrid/follow-me spectroscopy (up to 8192 x 8192 pixel for grid and subgrid) |
| spectroscopy type | z-spectroscopy, bias spectroscopy, generic spectroscopy (all GUI parameters), dI/dV with internal Lock-In |
| averaging | 1 us up to 10 s per data point |
| experiments | bias spectroscopy, Z-spectroscopy, generic spectroscopy including time spectroscopy. All modes can be combined with lock-in measurements. |
| data acquisition speed | up to 20 kS/s for bias and Z-spectroscopy, up to 1 MS/s for high-speed generic spectroscopy |
| timing control | start and end settling times, settling time per point, integration time per point. All timing is deterministic. Variable spectroscopy resolution/timing possible |
| autoretract | arbitrary threshold condition, including dual-condition autoretract |
| data display | real-time display for measurements > 2s |
| custom spectroscopy | possible with programming interface or scripting |
| Second Pass Mode | |
| second pass mode - working principle | multipass with up to 512 passes with different parameter set |
| second pass mode - parameters | playback recorded pass with parameter offset, wait time, slew rate, speed ratio, alternate setpoint, lock-in on/off |
| application for second pass mode | e.g. MFM, SGM, EFM, KPFM |
| Lock-In | |
| number of lock-ins | 1 dual-phase lock-in, up to 8 dual-phase lock-ins possible |
| low frequency Lock-In | 10 mHz - 50 kHz modulation frequency, 120 dB dynamic range, > 100 dB effective dynamic reserve, THD+N better than 90 dB |
| modulation | all DAC channel and most internal signals |
| high frequency Lock-In | 100 Hz - 5 MHz |
| integration time | sync filter and/or low-pass filters (1. to 8. order), cut-off frequency of 75 uHz to 20 kHz (low-frequency Lock-in), 95 mHz to 50 kHz (high-speed Lock-in) |
| lock-in usage | AFM cantilever signal, tuning fork signal etc. (high frequency Lock-In), spectroscopy, vibrational analysis, electrical transport, magnetotransport (low frequency Lock-In) |
| Optical Data | |
| oscilloscope | single and dual channel oscilloscopes, arbitrary channels, time base 128 ms to 6.4 s, 2 kHz range, 8192 pixel. Optional 4-channel oscilloscope and spectrum analyzer (time base 32 us to 17 minutes, 1M |
| FFTs | spectrum analyzer, 0-1 kHz range, windowing options, variable averaging. Optional 500 kHz spectrum analyzer |
| Options and Upgrades | |
| features (transfer function) | various current preamplifiers, up to 2 MCVA5 differntial voltage preamplifiers. I/O extension to up to 24 inputs and 40 outputs or 16 inputs and 48 outputs. Dual-PLL. RF source up to 40 GHz |
| features (crosslink) | up to 8 lock-ins, up to 8 generic P/I loops, KPFM-Module, Atom-tracking module, real-time scripting module, 4-channel oscilloscope module, Multi-Modulator module, Trigger engine-module |
| Scan control | |
| scan engines | 2 independent scan engines, one for standard measurements and spectroscopy (20 kpixel/s), one for high speed or very high resolution scanning (1 Mpixel/s) |
| scan management | on the fly scan pattern control (size, position, rotation), with independent visualization controls (zoom, position,…) All parameters can be adjusted without stopping data acquisition |
| history display | up to 50 acquired images can be pasted to scan display background, background management tool |
| tilt compensation | automatic for full scan frame or user-defined area |
| scan display | up to 7 scan displays |
| multipass mode | records any signal on first pass and plays it back on following passes. Multiple passes with configurable z-offset, bias, scan speed and setpoint settings, independent for forward and backward |
| point and shoot spectroscopy | any spectroscopy measurement, or any custom routine or script can be executed on the fly during scan |
| scangrid spectroscopy | combined scan and grid spectroscopy. Topographic information with scan resolution and user configura |
| spectroscopy experiments | all standard experiments, additionally any routine configured in scripting or programming interface |
| Programming interface | |
| labVIEW Programming interface | library of VIs that allows a flexible implementation of user-defined and automated measurement routines. Full control of the Nanonis SPM controller over the Programming Interface. Direct control of ex |
| generic Programming interface | same functionality as LabVIEW programming interface, compatible with any programming language (Pytho |
| python interface | python interface for the generic programming interface available on pypi.org |
| Simulation mode | |
| installation | simulation mode available with software, no limit in number of installations. Additional standalone STM simulator applciation |
| functionality | simulates a Si(111) surface, allows simulated STM measurements and access to full software fucntionality over programming interfaces |
| scope | training without hardware, testing of programming interface and scripting routines |
General Features of Nanonis Mimea
state-of-the-art SPM controller
State-of-the-art Hardware
benchmark of scanning probe microscopy
Comprehensive SPM base package enables all standard AFM measurement modes (topography, MFM, PFM, KPFM, ct-AFM,…). It features 8 DAC channels, 8 ADC channels and a lock-ins by default (upgradeable up to 24 in- and output channels and up to 8 independent lock-ins), high-speed spectroscopy channels, and a high-frequency oscillation controller OC4. With MCVA5 preamp, the differential input noise density is as low as <4nV/√Hz @10kHz.
High Level of Configurability
full control by the user
Fully asynchronous multitasking interface with independent control of all functions is completely configurable by the user, so that measurement conditions can be adjusted to specific application purposes or sample´s properties.
Automation for Higher Precision
built-in delight features
Nanonis Mimea features automated procedures for better user experience. For example, the Perfect PPL feature automatically adjusts PLL settings in 2 simultaneously running feedback loops in order to match the bandwidths, and the SafeTip™ option automatically prevents crashing the tips.
High-Speed Performance
swift time-to-result
Experience precision and flexibility with the Nanonis Mimea™ SPM control system. It offers high-speed and multipass scanning along with high-speed spectroscopy, and integrates oscilloscopes, spectrum analyzers (FFT), data loggers, charts, and graphs, providing a comprehensive suite for data analysis. Additionally, the advanced spectroscopy capabilities allow for experiments at user-defined points, lines, clouds, grids, or combined scan-grids.
Versatile Software
taylored to your needs
Do you need to add elaborate control or programming schemes? No worries! Rich application programming interface (API), both for LabVIEW and a generic script-language TCP, enables you to programmatically control all Nanonis modules and thus automate routines for specially designed experiments in any coding language.
Software Upgrades for Transport Measurements
best of both worlds
The Nanonis Mimea SPM base package and the Nanonis Tramea quantum transport measurement system use the same hardware. So, the users of an attocube microscope can use the Nanonis Mimea hardware to perform also transport measurements with an atto3DR double rotator and the appropriate software upgrade. In addition, there is an extremely versatile n-dimensional sweeper that allows for automated, unsupervised long measurement cycles over a variety of parameters.
