Measuring Water Surface Displacements made with the displacement sensor

Measuring Water Surface Displacements

To measure the displacements of a cup’s water surface compared to the displacements of the table the cup is positioned on, two focused sensor heads were used: one of them focused on the water surface, the other focused on a mirror fixed to the table, while the table was hit by a hammer. The water surface oscillates with a maximum deflection of approximately ± 20 µm and the table oscillates with a maximum amplitude of around ± 0.7µm. The zoom highlights that the two measurement arms show similar behaviors in the high frequency range for the first milliseconds after the excitation.

This measurement was realized with the Displacement Measuring Interferometer.

Characterizing a scanning fluorescence X ray microscope  made with the displacement sensor

Characterizing a scanning fluorescence X-ray microscope

When developing an X-Ray microscope capable of nm resolution, careful design is a must. Thermal and mechanical stability of the components and assemblies has to be followed throughout the process. The FPS shows superior performance regarding its outstanding stability and its capability of measuring sub-nm displacements. The senor has a better than 1.25 nm stability over 40 hours, and a better then 300 pm resolution at 100 Hz bandwidth in a controlled environment. The FPS is therefore the ideal supplement for the mechanical control of all components used in the described X-Ray microscope setup achieving a resolution in the order of 40 nm, while the stability is below 45 nm over the entire time needed for data collection.

This measurement was realized with the Displacement Measuring Interferometer.