Recent developments in nanotechnology have opend up new research possibilities by pushing critical dimensions well into in the nanometer range. As an immediate consequence, traditional optical inspection tools have become obsolete and techniques such as Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) have emerged as the new shining stars of our nano-age world.
Over the last years, electron microscopes have become state of the art tools not only for visual but also for spectroscopic characterization of nano-scale objects. Working under vacuum conditions in confined space, however, imposes new challenges for supportive tools for electron microscopy. These restrictions become particularly evident if complex tools for physical sample characterization and manipulation are to be operated inside an electron microscope.

attocube systems is able to keep up with these challenges and provides a full range of highly stable and reliable tools designated for in-situ operation in all SEMs currently on the market. Our product portfolio ranges from tuning-fork and cantilever-based Atomic Force Microscopes (AFM) over Probe Stations to highly reliable nanopositioning devices with 10 nm positioning accuracy using an optical encoder (optional).