attoAFM I
in-situ SEM AFM with interferometric sensor
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The in-situ SEM attoAFM I is an offshoot of attocube's successful low temperature atomic force microscope series. With a decade of experience in scanning probe microscopy, attocube systems has succeeded in equipping the attoAFM I with all virtues important for a successful operation inside of an electron microscope. Thanks to its extremely rugged design and minituarized size, the force microscope can be fully integrated into virtually any electron microscope currently available on the market. Once mounted inside the SEM via a custom made adapter plate, its 45° tilted design allows to have full visual access to both AFM tip and sample using the SEM.
As a further plus, the attoAFM I is compatible with nearly all commercially available cantilevers. This allows not only to image surface topographies, but it also allows to visualize for example surface magnetic or electrostatic properties by using appropriate cantilevers (magnetically coated and conducting, respectively). By varying the stiffness of the cantilever, nanoindentation (diamond tip) and tensile strength experiments can be easily conducted.

The attoAFM can be equipped with attocube's encoded ANP101-series positioners, allowing closed loop coarse positioning of tip and sample.

Customized attoAFM I with full visible access to the tip and sample.