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attoRAMAN xs
low temperature confocal Raman microscope
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The attoRAMAN xs combines a high resolution, low temperature confocal microscope with ultra sensitive Raman optics. This innovative product enables state of the art confocal Raman measurements at cryogenic environments combined with magnetic fields of up to 15 T. It is a ready-to-use system and is delivered with Raman laser source (532 nm / 633 nm wavelength as excitation source available), ultra-high throughput spectrometer including a peltier-cooled, back-illuminated CCD, and a state-of-the-art Raman controller/software package.
Principle - Tha attoRAMAN uses free-beam optics to focus laser light onto a substrate. The reflected light is then collected by room temperature optics while the Rayleigh signal is being suppresed by a notch/edge filter. The remaining signal, containing the Raman information, is then guided into a highly sensitive spectrometer using a single- or multimode fiber (depening on the application). The spectrometer allows to analyze the wavenumber depenpdent Raman intensity with a resolution of up to 1 cm-1 as close as 100 wavenumbers to the Rayleigh line.
Objective Systems - attocube systems offers several low temperature confocal objectives
which can be adjusted depending on your experimental requirements,
the wavelength range, working distance, and other parameters. For
customized solutions, please contact our office.
Request Quotation & Support : |
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Available
Controller for this Product: |
| ANC350 |
Piezo positioning controller
for attocube's encoded positioners | |
| ANC300 |
Piezo positioning controller
for attocube's open-loop positioners | |
Complete
System Solutions: |
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Complete system
configurations for this product. |
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| Product
Key Features
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true low temperature confocal Raman microscope |
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modular beam splitter and filter optics at room temperature |
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ultra-high transmission spectrometer and peltier-cooled back-illuminated CCD |
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pixel resolution 1/cm at 1800/mm grating |
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measurements as close as 100/cm to the Rayleigh line |
| Benefits
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fits
standard cryogenic and magnet sample spaces |
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broad variety
of applications ranging from simple 2D Raman images to Raman spectra along arbitrary 3D llines wihtin the sample |
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excellent stability
for long integration times and weakest signal detection |
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highest measurement
sensitivity |
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access to a large
area on the sample surface |
| Raman images of epitaxially grown Graphene layers, showing the SiC substrate (top) and the Graphene 2D band (bottom). Left images were recorded at 300 K, right images at 4.2 K. |
| Raman spectra recorded at 4.2 K, depicting (from top to bottom) monolayer and bilayer graphene, and the edge of the latter. The shift in 2D band from mono- to bilayer Graphene corresponds to approximately 14 cm-1. |
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