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attoMFM Ixs
low temperature magnetic force microscope, cantilever based
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The attoMFM Ixs is an ultra-compact magnetic force microscope
designed particularly for applications at low and ultra low temperature.
On the basis of a conventional atomic force microscope, the instrument
works by scanning the sample below a fixed magnetic cantilever.
The magnetic force gradient acting on the tip is then determined
by measuring the change in resonance frequency (FM mode) or
phase of the cantilever (AM mode) with highest precision using
a fiber-based optical interferometer. Both measurement modes are
applied at a certain tip-sample distance, typically around 10 - 100 nm.
In FM mode, a phase-locked loop (PLL) is used to excite the cantilever
at resonance.
Principle - The microscope uses a set of xyz-positioners
for coarse positioning of the sample over a range of several mm.
Developed particularly for cryogenic applications, the piezo scanner
ANSxy50 provides a scan range of 12 x 12 µm2 even at liquid
helium temperature. The adjustment of the MFM cantilever is performed
outside of the cryostat prior to cooling down the microscope. The
exceptional combination of materials allows absolutely stable high
resolution imaging of surfaces.
Request Quotation & Support : |
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Available
Controller for this Product:
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FPGA-based, fully digital SPM controller
with xy-scan generator incl. feedback control und phase locked loop (PLL)
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| ANC350 |
Piezo positioning controller
for attocube's encoded positioners| |
| ANC300 |
Piezo positioning controller
for attocube's open-loop positioners | |
Complete
System Solutions:
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Complete system
configurations for this product. |
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| Product
Key Features
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ultra compact
MFM head |
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highly sensitive interferometric
deflection detection |
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unreached mechanical stability |
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adjustment of the cantilever
outside the cryostat prior to cooling the microscope |
| Benefits
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high spatial resolution
imaging |
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simultaneous ultra high resolution
topographic and
magnetic force imaging |
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compatible with any commercially
available MFM probe |
MFM
measurement on ferro-magnetic Co dots recorded at 4.2 K
with the attoMFM Ixs. (attocube application
labs, 2009; sample courtesy of M. Evangelisti, J. Sesé,
University of Zaragoza; Spain). |
| Magnetic phase image of a BaFeO
sample at ambient conditions. (attocube application
labs, 2009; sample courtesy of R. Kramer, Leuven University,
The
Netherlands). |
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