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attoCFM xs
compact low temperature scanning confocal microscope, fiber or
free-beam based system
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The attoCFM xs has been developed to offer highest flexibility
combined with maximum mechanical stability for low temperature
confocal microscopy experiments. The attoCFM xs can be ordered
with either free-beam or fiber based optics. In case of the free-beam
optics, excitation and collection ports are completely independant,
allowing the introduction of further optical components (e.g. filter
or polarizer) and enabling measurements such as Raman spectroscopy.
Offering slightly less flexibility, the fiber based setup is designed
for highest mechanical stability allowing single quantum dot measurements
over a timespan of several weeks and operation in cryogen-free
cryostats.
Principle - The microscope uses a set of xyz-positioners
for coarse positioning of the sample over a range of several mm.
Developed particularly for cryogenic applications, the piezo scanner
ANSxy50 provides a scan range of 12 x 12?µm2 even at liquid
helium temperature.
Request Quotation & Support : |
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Available
Controller for this Product:
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FPGA-based, fully digital SPM controller
with xy-scan generator incl. feedback control und phase locked loop (PLL)
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| ANC350 |
Piezo positioning controller
for attocube's encoded positioners| |
| ANC300 |
Piezo positioning controller
for attocube's open-loop positioners | |
Complete
System Solutions:
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Complete system
configurations for this product. |
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| Product
Key Features
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ultra compact
CFM head |
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fiber based or free-beam optics |
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fully adjustable excitation
and collection ports (free-beam) |
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wavelength or polarization
filtering (free-beam) |
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ultra-stable
design (fiber based) |
| Benefits
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fits 1” clear
bore cryostats and magnets |
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highest flexibility and sensitivity
combined with minimal light loss |
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access to optical spectroscopies
such as Raman spectros-copy (free-beam) |
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highly stable long term measurements |
Confocal
image of red blood cells fixed on a glass slide. The image
was recorded with the fiber based CFM in reflection mode
(scan voltage 30 V). |
| Confocal image of a pattern
of 1 µm holes in a silicon nitride layer on gold recorded
with the fiber based CFM in reflection mode. Surface defects
smaller than 500 nm are well resolved. |
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