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INTRODUCTION

HIGH PERFORMANCE PLATFORMS

 

CONFOCAL IMAGING

 

attoCFM I
 

attoCFM-DRY
 

attoRAMAN
 

OPTIONAL CONFIGURATIONS
 

MAGNETIC IMAGING

 

attoMFM I
 

attoSHPM
 

SURFACE CHARACTERIZATION

 

attoAFM I
 

attoAFM/SEM
 

attoSPHERE
 

CRYOGENIC PROBE STATIONS

 

attoCPS I
 

attoCPS II
 

attoPROBESTATION
 

ACCESSORIES

CUTTING EDGE RESEARCH SYSTEMS

 

attoCSFM
 

attoSNOM
 

attoAFM III
 

attoAFM/STM
 

attoAFM/CFM
 

attoSTM

FUNDAMENTALS

 

CFM
 

SNOM
 

MFM
 

SHPM
 

AFM
 

STM
 

CLOSED LOOP SCANNING

 

 


attoSPHERE
ultra compact scanning tunneling microscope, table-top ready
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The attoSPHERE is a scanning tunneling microscope, designed particularly for room temperature application in demanding conditions, including variable temperature environments and facilities with non-ideal mechanical damping. With its unique material combination, almost exclusively consisting of Invar and ceramics, and its thermally compensated cylindrical design, the attoSPHERE allows the user to obtain atomic resolution images in no time - even in non-ideal lab conditions. With its plug-andmeasure capabilities, the attoSPHERE is ideally suited for topographic and spectroscopic measurements, rapid process control, failure analysis in nanoelectronics, and fundamental research applications. The attoSPHERE is compatible with the highest class cleanrooms and high vacuum conditions.

Principle - The attoSPHERE consists of a cylindrical microscope head which rests self-centered on a sample platform. The microscope head can simply be lifted off for rapid sample exchange. A specifi cally developed coarse positioner allows to approach the STM tip with highly repetitive steps of 75 nm size towards the sample. A fast feedback loop and high repition rates allow to conduct this coarse approach in a matter of minutes.

 
Schematic drawing of the attoSPHERE  
   
The attoSPHERE can simply be disassembled by lifting off the self-aligning microscope head from the sample platform
   
Tip and sample are magnetically fixed to the sample platform and scan tube, respectively.
   
Tip and sample can be removed in a matter of seconds.

 

SPECIFICATIONS

MICROSCOPE SETUP
STM sensor unit
cut or etched metal tip; optical access for tip-sample approach
STM tips Pt/Ir or W wire, typically 250-500 μm diameter
current detection low noise amplifier with variable gain and bandwidth
gain range 1E3 .. 1E11 V/A
sample bias bias voltage applied to tip; current measured at the sample
bias voltage range ±10 V
bias output noise (using ASC500) 100 μVpp (10 Hz - 100 kHz)
20 μVpp (10 Hz - 1 kHz)
   
OPERATION MODE
feedback modes constant current, constant height
spectroscopy modes current-distance (I/z), current-voltage (I/V), conductance (dI/dV), point contact spectroscopy
   
SAMPLE POSITIONING
positioners and scanners modified coarse positioner with piezo scan tube
coarse range 5 mm
step size (300 K) 0.05 .. 1.5 μm, 75 nm at 30 V during coarse approach
scan range 1.4 x 1.4 μm²
sample monitoring sample / tip monitoring via CCD camera (optional)
   
OPERATING CONDITIONS
temperature range 300 .. 400 K
operating pressure range 1E-6 mbar .. 1 bar
   
DIMENSIONS
diameter x height (microscope head) 32.5 mm x 43 mm
diameter x height (sample platform) 35 mm x 7 mm
maximum sample size Ø 10 mm or 7 mm x 7 mmm
   
SCAN CONTROLLER
ASC500 SPM controller for detailed specifications please see attoCONTROL section

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Additional Information:






> compensated Invar/ceramics design for minimal drift in variable temperature environments
> extremely high resonance frequencies due to ultra compact size and rigid design
> place-and-operate functionality
> solid-liquid interface investigations

> atomic resolution STM/STS measurements even under non-ideal environmental conditions
> rapid sample exchange and coarse approach for ultra-fast turn-around times

> STM/STS measurements in fundamental research applications
> rapid process control for nanodevices and nanoelectronics