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attoPROBESTATION
in-situ SEM probe station
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When built into high-resolution scanning electron microscopes (SEMs), attocube’s NTS product line provides access to a variety of applications in the fi elds of materials research, life science, and biology. Boosted by its superior mechanical stability and the integrated lowcurrent four-probe measurement system, the attoProbeStation excels in the characterization of electrical devices and advanced materials on the sub-nanometer scale. The attoProbeStation is based on attocube’s state-of-the-art, modular nanopositioning devices which can be equipped with optical or resistive encoders for closed-loop operation (optional).
The attoProbeStation consists of four probes which can be positioned independently of each other, allowing probe movement in Cartesian coordinates with sub-nm resolution in all directions. Each probe is electrically contacted by highest quality coaxial cables, ensuring low current, high signal-to-noise electrical measurements.Taking advantage of a specially designed probe retainer makes the station fully compatible with most commercially available probes. Most important, however, is the fact that attocube’s probe station can be operated in most available SEMs without any decrease in the SEM’s functionality. As an upgrade option, attocube offers a mounting platform for the attoProbe Station which includes two ANTx200/NUM/HV positioners, allowing fully automated sample positioning within an area of 7 x 7 mm² with a positioning resolution of 10 nm. An additional ANR51 rotator allows for endless rotation of the sample.
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attocube's attoPROBESTATION in combination with the mounting platfom
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| Specifications |
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| Probe station setup |
configuration |
up to 4 independent probes, encoded sample positioning |
| Probe positioning |
probe positioning |
each probe mounted on an independent ANPxyz51 positioning stage |
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number of probes |
up to 4 probes, each to be positioned in xyz |
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probe travel range |
2.5 x 3 x 3 mm³ manipulation space for each probe |
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minimum step size |
approx. 25 nm @ 300 K |
| Sample positioning |
sample positioning |
encoded sample positioning with 2x ANTx200/NUM/HV, endless
rotation with ANR51 or vertical movement with ANPz51 (optional) |
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sample travel range |
7 x 7 mm², 360° endless or 2.5 mm in z- direction |
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encoder type |
optoelectronic encoder (non-contact ) |
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sensor resolution |
10 nm |
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repeatability |
50 nm |
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absolute accuracy |
approx. 1 μm |
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maximum speed (@ 300 K,
no load) |
approx. 3 mm/s |
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operating temperature range |
0 - 100 °C |
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minimum pressure |
1E-8 mbar |
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connection type |
15-pin D-Sub for positioning stage, SMA for electrical probes |
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Request Quotation & Support : |
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| Benefits
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plug-and-play compatibility with virtually all
SEMs
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allows both electrical measurements and
mechanical manipulation on the nanometer
scale |
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can be equipped with optical encoders for
highest precision closed-loop operation |
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emounted directly onto the SEM sample translation
stage |
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