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INTRODUCTION

HIGH PERFORMANCE PLATFORMS

 

CONFOCAL IMAGING

 

attoCFM I
 

attoCFM-DRY
 

attoRAMAN
 

OPTIONAL CONFIGURATIONS
 

MAGNETIC IMAGING

 

attoMFM I
 

attoSHPM
 

SURFACE CHARACTERIZATION

 

attoAFM I
 

attoAFM/SEM
 

attoSPHERE
 

CRYOGENIC PROBE STATIONS

 

attoCPS I
 

attoCPS II
 

attoPROBESTATION
 

ACCESSORIES

CUTTING EDGE RESEARCH SYSTEMS

 

attoCSFM
 

attoSNOM
 

attoAFM III
 

attoAFM/STM
 

attoAFM/CFM
 

attoSTM

FUNDAMENTALS

 

CFM
 

SNOM
 

MFM
 

SHPM
 

AFM
 

STM
 

CLOSED LOOP SCANNING

 

 


attoPROBESTATION
in-situ SEM probe station
:.........................................................................................

When built into high-resolution scanning electron microscopes (SEMs), attocube’s NTS product line provides access to a variety of applications in the fi elds of materials research, life science, and biology. Boosted by its superior mechanical stability and the integrated lowcurrent four-probe measurement system, the attoProbeStation excels in the characterization of electrical devices and advanced materials on the sub-nanometer scale. The attoProbeStation is based on attocube’s state-of-the-art, modular nanopositioning devices which can be equipped with optical or resistive encoders for closed-loop operation (optional).

The attoProbeStation consists of four probes which can be positioned independently of each other, allowing probe movement in Cartesian coordinates with sub-nm resolution in all directions. Each probe is electrically contacted by highest quality coaxial cables, ensuring low current, high signal-to-noise electrical measurements.Taking advantage of a specially designed probe retainer makes the station fully compatible with most commercially available probes. Most important, however, is the fact that attocube’s probe station can be operated in most available SEMs without any decrease in the SEM’s functionality. As an upgrade option, attocube offers a mounting platform for the attoProbe Station which includes two ANTx200/NUM/HV positioners, allowing fully automated sample positioning within an area of 7 x 7 mm² with a positioning resolution of 10 nm. An additional ANR51 rotator allows for endless rotation of the sample.

attocube's attoPROBESTATION in combination with the mounting platfom

 

Specifications    
     
Probe station setup configuration up to 4 independent probes, encoded sample positioning
Probe positioning probe positioning each probe mounted on an independent ANPxyz51 positioning stage
  number of probes up to 4 probes, each to be positioned in xyz
  probe travel range 2.5 x 3 x 3 mm³ manipulation space for each probe
  minimum step size approx. 25 nm @ 300 K
Sample positioning sample positioning encoded sample positioning with 2x ANTx200/NUM/HV, endless
rotation with ANR51 or vertical movement with ANPz51 (optional)
  sample travel range 7 x 7 mm², 360° endless or 2.5 mm in z- direction
  encoder type optoelectronic encoder (non-contact )
  sensor resolution 10 nm
  repeatability 50 nm
  absolute accuracy approx. 1 μm
  maximum speed (@ 300 K,
no load)
approx. 3 mm/s
  operating temperature range 0 - 100 °C
  minimum pressure 1E-8 mbar
  connection type 15-pin D-Sub for positioning stage, SMA for electrical probes
     



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Additional Information:







> plug-and-play compatibility with virtually all
SEMs
> allows both electrical measurements and
mechanical manipulation on the nanometer
scale
> can be equipped with optical encoders for
highest precision closed-loop operation
> emounted directly onto the SEM sample translation
stage