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attoAFM/CFM
combined low temperature atomic force and confocal microscope, tuning fork based
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The tuning fork based attoAFM/CFM not only allows fast optical investigation of the sample prior to detailed AFM studies, it also enables precise positioning of the AFM tip over small structures and optical control of the scanning process or any surface manipulation. Plus, optical experiments such as Raman Spectroscopy and Tip Enhanced Raman Spectroscopy (TERS) can be conducted. Needless to say that all of these tasks can be performed in extreme environments, such as ultra low temperature, high vacuum and magnetic fields.
Principle - The attoAFM/CFM uses an Akiyama probe tip to investigate any tip-sample interaction forces on the nanometer scale. The Akiyama probe is typically operated in non-contact mode using a phase-locked loop to excite the probe at resonance and track any shift in frequency due to tip-sample interactions. An additional PI controller keeps the frequency shift at a constant value while scanning over the surface. Simultaneously to the information provided by the Akiyama probe, the CFM reveals complementary optical information of the sample surface. Since the z-scanning motion is provided by a dedicated scanner on the side of the AFM, the focal distance between the low-temperature compatible lens and the sample does not change.
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Available
Controller for this Product:
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FPGA-based, fully digital SPM controller
with xy-scan generator incl. feedback control und phase locked loop (PLL)
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| ANC350 |
Piezo positioning controller
for attocube's encoded positioners| |
| ANC300 |
Piezo positioning controller
for attocube's open-loop positioners | |
Complete
System Solutions:
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Complete system
configurations for this product. |
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Key Features
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independent sample scanning and scanning of the AFM module |
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tuning fork based and PLL controlled AFM |
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objectives with various working distances available
(e.g. 1.56 mm, or 2.91 mm) |
| Benefits
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suitable for conducting and non-conducting samples |
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enables exact positioning of AFM tip |
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optical access to the sample with high magnification |
| Confocal image of the Akiyama probe in close proximity of a patterned SiO2 /Si substrate. The image clearly shows a pronounced backscattering of light at the AFM tip apex (attocube application labs, 2009). |
| Tuning fork AFM image of the SiO2 /Si substrate as imaged beforehand using the CFM (see figure above). The height modulation corresponds to 51 nm (attocube application labs, 2009). |
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