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INTRODUCTION

CFM

attoCFM I

attoRAMAN

attoCFM II

attoCFM III

attoCFM-Ptc

AFM

attoAFM I

attoAFM III

attoAFM/STM

attoAFM/CFM

MFM

attoMFM I

SHPM

attoSHPM

SNOM

attoSNOM III

STM

attoSTM I

APPLICATION NOTES

PUBLICATIONS

OPTIONS

SNOM FIBER PROBES

ACCESSORIES

 

 


attoAFM III
low temperature atomic force microscope, tuning fork based
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The attoAFM III is an atomic force microscope designed particularly for applications at low and ultra low temperature. Due to the non-optical shear force detection based on a tuning fork, this system is ideally suited for applications where input of light is problematic. A typical application of the attoAFM III microscope is Scanning Gate Microscopy (SGM) on semiconductor structures. This microscope is also compatible with the commercially available Akiyama probe.


Principle - the attoAFM III uses a tuning fork sensor as detection mechanism for the tip-sample separation, allowing high resolution non-contact mode imaging without the need for any optical deflection detection techniques. In general, an AFM tip is glued onto one leg of a small quartz tuning fork and forced to oscillate in horizontal direction with an amplitue of typically 50 pm. Damping of the amplitude due to tip-sample interaction when approaching the sample is monitored and/or used as a feedback signal. The force resolution of this technique is typically 0.1 pN.

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Additional Information:

Available Controller for this Product:
FPGA-based, fully digital SPM controller with xy-scan generator incl. feedback control und phase locked loop (PLL)
ANC350 Piezo positioning controller for attocube's encoded positioners|
ANC300 Piezo positioning controller for attocube's open-loop positioners |

Complete System Solutions:
Complete system configurations for this product.






> ultra compact AFM head with unprecedented stability
> highly sensitive, non-optical tuning fork sensor
> LT compatible preamplifier located in close proximity to tuning fork

> ultra high resolution imaging in non-contact mode
> high Q factor for highest sensitivity measurements
> optimized S/N ratio due to LT compatible preamplifier
> no optical alignment necessary