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INTRODUCTION

HIGH PERFORMANCE PLATFORMS

 

CONFOCAL IMAGING

 

attoCFM I
 

attoCFM-DRY
 

attoRAMAN
 

OPTIONAL CONFIGURATIONS
 

MAGNETIC IMAGING

 

attoMFM I
 

ALIGNMENT-FREE CANTILEVER
 

attoSHPM
 

SURFACE CHARACTERIZATION

 

attoAFM I
 

ALIGNMENT-FREE CANTILEVER
 

attoAFM/SEM
 

attoSPHERE
 

CRYOGENIC PROBE STATIONS

 

Photonic Probe Station
 

attoCPS I
 

attoCPS II
 

attoPROBESTATION
 

ACCESSORIES

CUTTING EDGE RESEARCH SYSTEMS

 

attoCSFM
 

attoSNOM
 

attoAFM III
 

attoAFM/STM
 

attoAFM/CFM
 

attoSTM

FUNDAMENTALS

 

CFM
 

SNOM
 

MFM
 

SHPM
 

AFM
 

STM
 

CLOSED LOOP SCANNING

 

 


attoAFM I
low temperature atomic force microscope, cantilever based
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The attoAFM I is a compact atomic force microscope designed particularly for applications at low and ultra low temperatures. The instrument works by scanning the sample below a fixed cantilever and by measuring its deflection with highest precision using a fiber based optical interferometer. Both contact and non-contact mode are applicable. Furthermore, this system is suited for Magnetic Force Microscopy (MFM), Electric Force Microscopy (EFM), and other imaging modes.
The extreme stability of the measurement head allows also for combination with cryogen free pulse-tube based cooling systems for applications where liquid Helium is not available or desired.

01 LT and HV compatible feedthroughs

02 vacuum window

03 microscope insert

04 superconducting magnet (optional)

05 liquid He dewar (optional)

06 ultra stable Titanium housing

07 xyz coarse positioners

08 xy scanner

09 sample

10 SM fiber for interferometric deflection detection

11 commercially available cantilever

Scheme of a cryogenic AFM insert including cryostat and superconducting magnet.
 


Principle - The microscope uses a set of xyz-positioners for coarse positioning of the sample over a range of several mm. Developed particularly for cryogenic applications, the piezo scanner ANSxy100 provides a scan range of 30 x 30?µm2 even at liquid helium temperature. In the attoAFM?I configuration, the adjustment of the cantilever is performed outside of the cryostat prior to cooling down the microscope. The exceptional combination of materials allows absolutely stable high resolution imaging of surfaces. Possible applications are the measurement of local sample properties such as topography, magnetic forces, or elasticity of surface structures.

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Additional Information:

Available Controller for this Product:
FPGA-based, fully digital SPM controller with xy-scan generator incl. feedback control und phase locked loop (PLL)
ANC350 Piezo positioning controller for attocube's encoded positioners|
ANC300 Piezo positioning controller for attocube's open-loop positioners |

Complete System Solutions:
Complete system configurations for this product.






> ultra compact AFM head with unprecedented stability
> highly sensitive, non-optical tuning fork sensor
> LT compatible preamplifier located in close proximity to tuning fork

> ultra high resolution imaging in non-contact mode
> high Q factor for highest sensitivity measurements
> optimized S/N ratio due to LT compatible preamplifier
> no optical alignment necessary