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attoSNOM III
fiber based, low temperature scanning near-field optical microscope,
tuning fork sensor
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he attoSNOM III uses a non-optical, tuning fork based distance
control system for highest stability and accuracy. This control
system uses a piezoelectric quartz sensor for highly sensitive
shear force detection and an electronic feedback loop (phase-locked
loop, PLL) to keep the tip-sample separation constant. In addition
to these mechanical properties, a high-quality optical fiber probe
tip ensures highest light throughput and resolution.
As an optional configuration, the system can also be equipped with
an ellipsoidal aluminum mirror in order to collect the signal scattered
by the sample surface. Overall, the attoSNOM III impresses by its
outstanding sensitivity combined with high spatial resolution.
The attoSNOM III is compatible with any fiber-based SNOM probe.
Principle - The excellent spatial
resolution of the attoSNOM III is achieved by approaching
the aperture of an aluminum coated, tapered optical fiber tip to
close proximity of the sample surface and by precisely controlling
the tip-sample separation by means of a tuning fork sensor. In
order to achieve highest stability and to minimize parasitic cable
capacitance, the tuning fork is directly mounted onto a low temperature
preamplifier. In a typical imaging application, the vibrational
amplitude of the tip is adjusted to about 50 pm and the tip-sample
separation is kept constant by using a phase-locked loop and a
PI controller on the frequency shift. The optical fiber-based probe
is used to illuminate or excite the sample surface locally. The
reflected signal containing the information about local sample
surface properties (such as refractive index, chemical properties,
photoluminescence etc.) is either collected through the same fiber
or by an ellipsoidal aluminum mirror (optional).
Request Quotation & Support : |
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Available
Controller for this Product:
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FPGA-based, fully digital SPM controller
with xy-scan generator incl. feedback control und phase locked loop (PLL)
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| ANC350 |
Piezo positioning controller
for attocube's encoded positioners| |
| ANC300 |
Piezo positioning controller
for attocube's open-loop positioners | |
Complete
System Solutions:
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Complete system
configurations for this product. |
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| Product
Key Features
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designed
for highest stability |
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non-optical distance
control by quartz tuning fork |
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simple transmission
detection possible |
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flexible design |
| Benefits
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high
spatial resolution imaging |
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simultaneous ultra
high resolution topographic and
optical imaging |
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compatible with
any fiber-based SNOM probe |
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enables reflection
measurements with ellipsoidal mirror |
| Tuning fork topographic
measurement (a) and simultaneously obtained near-field measurement
in reflection (b) and transmission (c) at 4.2 K. Sample:
Vanadium rhomb-structure on a glass substrate with a layer
thickness of 50 nm (attocube application labs, 2007). |
| Reflection near-field
measurement recorded with the ASC500 PLL feedback loop. Sample:
Vanadium rhomb-structure on glass substrate with a layer
thickness of 50 nm (attocube application labs, 2008). |
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