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attoSNOM II
fiber based, low temperature scanning near-field optical microscope,
interferometric sensor
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The attoSNOM II works by scanning a sub-wavelength sized probe
in the near-field of a sample surface and has a novel for a variety
of scanning near-field optical microscopy applications. The probe-sample
distance control mechanism is based on an all fiber interferometer.
It works by detecting the damping of the oscillating tip by lateral
forces, the so-called ‘shear force‘, close to the surface.
One of the key features of this system is the ease of use due
to the simple tip-sample distance control using the interferometric
detection scheme and at the same time high optical efficiency due
to the fiber based SNOM tips.
Tip-Sample Distance Control - The distance control is performed
using the interferometric deflection detection scheme similar to
the one applied in attoAFMs. The schematic drawing to the left
describes the setup. A laser beam coupled into a single mode fiber
(port 1) is used to illuminate a Fabry-Perot interferometer via
a fiber coupler. At the end of the second arm (port 2), light is
reflected at the end interface of the fiber. The rest of the light
is transmitted and partially reflected at the SNOM fiber tip. Therefore,
the tip interface and the fiber end face form a Fabry-Perot interferometer.
A large part of the light reflected in this structure is coupled
back into the optical fiber and detected with Detector 1. Detector
2 mounted at arm 3 can be used to monitor the intensity emitted
by the laser (optional). Monitoring the intensity of the interference
fringes allows to measure the tip vibration amplitude. The precision
of the vibration amplitude measurement is 160 fm / Hz1/2.
Probes - This system is compatible with any fiber-based SNOM probe.
In general, it is a glass-fiber tip which can be covered with an
opaque metal layer. A clear aperture of sub-wavelength dimensions
is located at the tip apex and records the optical signal.
Request Quotation & Support : |
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Available
Controller for this Product:
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SPM controller
with xy-scan generator incl. feedback control und fully digital
phase locked loop (PLL)
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Piezo step controller for coarse
positioning | 1, 3 or 6-axes control | Optional: TFT-display,
TTL-input |
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Piezo scan
controller for ultra high resolution scan |
1 to 6-axes control
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Complete
System Solutions:
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Complete system
configurations for this product. |
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| Topography measurement (a) and
simultaneously obtained near-field measurement in reflection
(b) and transmission
(c) mode using the attoSNOM III at ambient conditions. Sample:
Vanadium rhomb-structure on glass substrate with a layer
thickness of 10 nm and a period of 5 µm. Distance control:
shear force measurement via piezo tuning fork. Probe: glass
fiber probe. |
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