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attoSNOM I
cantilever based low temperature scanning near-field optical microscope,
interferometric sensor
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The attoSNOM I works by scanning a cantilever in the optical near-field
of a sample surface. The near-field probe in attoSNOM I configuration
is a cantilever that acts simultaneously as a topographic sensor
in contact or modulation mode, and as an optical aperture. The
cantilever-based attoSNOM I offers an easy-to-use setup allowing
high quality topographic and optical imaging at cryogenic temperatures.
The system can be
applied for reflection as well as transmission measurements. One
of the key features of this system is the ease of use due to the
simple tip-handling and wellknown tip-sample distance control using
the interferometric detection scheme.
Tip-Sample Distance Control - The distance control
is performed using the interferometric deflection detection scheme
as also applied in attoAFMs. The schematic drawing to the left
describes the setup. A laser beam coupled into a single mode fiber
(port 1) is used to illuminate an interferometer via a fiber coupler.
At the end of the second interferometer arm (port 2), light is
reflected at the end interface of the fiber. The rest of the light
is transmitted and partially reflected at the AFM cantilever. Therefore,
the tip interface and the fiber end face form a Fabry-Perot interferometer.
A large part of the light reflected in this structure is coupled
back into the optical fiber and detected with Detector 1. Detector
2 mounted at arm 3 can be used to monitor the intensity emitted
by the laser (optional). Monitoring the intensity of the interference
fringes allows to measure the tip vibration amplitude. The precision
of the vibration amplitude measurement is 160 fm / Hz1/2.
Probes - The microfabricated cantilever SNOM sensor distributed
by WITec© consists of a silicon cantilever with a hollow aluminum
pyramid as a tip. This pyramid has a small aperture (~100 nm)
in diameter at its apex. One major advantage of these mass-produced
tips is the ease of probe handling unique in SNOM technology.
Request Quotation & Support : |
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Available
Controller for this Product:
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SPM controller
with xy-scan generator incl. feedback control und fully digital
phase locked loop (PLL)
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Piezo step controller for coarse
positioning | 1, 3 or 6-axes control | Optional: TFT-display,
TTL-input |
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Piezo scan
controller for ultra high resolution scan |
1 to 6-axes control
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Complete
System Solutions:
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Complete system
configurations for this product. |
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Topography measurement (top) and simultaneously
obtained near-field measurement
in transmission (bottom) using
the attoSNOM I. Sample: Vanadium rhomb-structure on glass
substrate with a
layer thickness of 10 nm and a period of 5 µm. Distance
control: interferometric sensor. (attocube application labs,
2007). |
| Optical transmission measurement of a detector glass
plate recorded using the attoSNOMI. Local defects are clearly
resolved. |
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