attoAFM III
low temperature atomic force microscope, tuning fork sensor
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The attoAFM III is a newly released atomic force microscope designed particularly
for applications at low and ultra low temperatures. Due to the nonoptical shear force detection based on tuning fork, this system is ideally suited for applications where input of light is problematic. A typical application is Scanning Gate Microscopy (SGM) on semiconductor structures. This system is also compatible with the commercially available Akiyama probe.

Principle - The attoAFM III uses a tuning fork sensor as detection mechanism for the tip-sample distance allowing highly sensitive AFM measurements in non-contact mode. This sensor uses a non-optical method for measuring small vibrations of the AFM probe by means of a quartz tuning fork. In general, the AFM tip is glued onto one leg of a small quartz tuning fork. The tip is vibrated in horizontal direction; as the tip approaches the sample in the nanometer range, the vibration amplitude of the tip decreases. This damping of the amplitude by the sample due to lateral forces, the so-called shear forces, is monitored or used as a feedback signal. The sensor allows to measure the tip–sample friction and shear forces ranging from about 0.1 pN to several nN. In this configuration, the whole system behaves like a simple forced harmonic oscillator. Alternatively, the commercially available Akiyama probe can be used.

As this deflection detection mechanism is non-optical, it is perfectly suited for e.g. Scanning Gate Microscopy (SGM) on 2-dimensional electron gases.

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Detailed Specification Sheet

Complete System Solutions:
LTSYS	Complete system configurations for this product.