attoAFM II
low temperature atomic force microscope, modular and flexible, interferometric sensor
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Analogous to the attoAFM I, the attoAFM II is an atomic force microscope built around an optical fiber based interferometer. The sensor is compatible with any commercial cantilever and measures the vertical deflection of the cantilever with picometer resolution. The microscope is designed to work in contact, non contact, and modulation mode. The attoAFM II has been designed to offer highest flexibility to the user. A second set of low temperature compatible xyz positioners enables adjustment of the optical fiber / cantilever also inside the cryostat after cooling down the microscope. Thus, ultimate flexibility is provided, e.g. upgrading the system to achieve SNOM functionality.

This system guarantees highest resolution imaging and optimized sensor adjustment in any environment: at room or low temperature, high magnetic field, and under high vacuum condition.

Principle - The attoAFM II has been designed to offer highest flexibility to the user. A second set of low temperature compatible xyz positioners enables adjustment of the optical fiber / cantilever also inside the cryostat after cooling down the microscope. Thus, ultimate flexibility is provided and e.g. upgrading the system to achieve SNOM functionality is possible. This system guarantees highest resolution imaging and optimized sensor adjustment in any environment: at room or low temperatures, high magnetic fields, and under high vacuum conditions.

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Detailed Specification Sheet

Complete System Solutions:
LTSYS	Complete system configurations for this product.