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attoAFM I
low temperature atomic force microscope, interferometric sensor
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The attoAFM I is a compact atomic force microscope designed particularly
for applications at low and ultra low temperatures. The instrument
works by scanning a cantilever accross a sample surface and by
measuring its deflection with highest precision using a fiber based
optical interferometer. Contact, non-contact, and modulation mode
are applicable.
Principle - The microscope uses a set of xyz-positioners
for coarse positioning of the sample over several mm. The particularly
for
cryogenic applications developed piezo scanner ANSxy100 provides
a fine scan range of 30 x 30 µm2 even at cryogenic temperatures.
In the attoAFM I configuration the adjustment of the cantilever
is performed outside of the cryostat prior to cooling down the
microscope. Optical inspection of the tip / sample is enabled
via a CCD camera and an IR-LED for illumination. The exceptional
combination of materials allows absolutely stable
high resolution imaging of surfaces. Possible applications are
the measurement of local sample properties such as topography,
magnetic forces, or elasticity of the surface structures.
Request Quotation & Support : |
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Available
Controller for this Product:
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SPM controller
with xy-scan generator incl. feedback control und fully digital
phase locked loop (PLL)
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| ANC150 |
Piezo step controller for coarse
positioning | 1, 3 or 6-axes control | Optional: TFT-display,
TTL-input |
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Piezo scan
controller for ultra high resolution scan |
1 to 6-axes control
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Complete
System Solutions:
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Complete system
configurations for this product. |
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AFM contact mode image
of ordered lattice of lateral InAs quantum dot molecules
recorded with the attoAFM I at 300 K (a) and 4.2 K (b).
The height of the quantum dots is ~ 5 nm. Distance control:
fiber based optical interferometer. (attocube application
labs 2007, sample: T. van Lippen, et al., J. Appl. Phys.
97, 044301, 2005).
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| Magnetic force image acquired on a commercial
hard disk. Protrusion and depression in the MFM image clearly
represent the magentic bit profile. (attocube application
labs 2007). |
| AFM contact mode image of a Si-Substrate /SiO2-Layer
(height: 20 nm +/- 2 nm) recorded at 4.2 K with the attoAFM?I.
Height of surface contaminations:
~ 1 nm. (attocube application labs 2007). |
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