INTRODUCTION NANOPOSITIONING

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In this section we present a wide range of solutions for positioning and scanning tasks where atomic resolution and travel in the centimeter range is required. Working environments from standard temperature and pressure conditions to ultra-low temperature (less than 10mK), ultra-high vacuum (5x10-11mbar) and high magnetic fields (31T) are covered.

Typical Applications:

	sample positioning in Scanning Probe Microscopy (SPM) such as STM, AFM, CFM, SNOM
	beam and device alignment such as laser-beams, optical fibers, solid state waveguides
	wafer or chip alignment inside Scanning Electron Microscopes (SEM) for quality control and production
	crystal orientation in synchrotron or neutron beam facilities
	sample rotation in high magnetic fields at low temperature