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INTRODUCTION

CRYOGEN-FREE SYSTEMS

LTSYS-Ptc

LTSYS-Cc

LIQUID HE BASED SYSTEMS

LTSYS-He

MEASUREMENT HEADS


MEASUREMENT HEADS

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The measurement task of your choice - The whole range of microscopy and probing
inserts available.

       
Available for
  Product  
Description
 LTSYS-
He4		 LTSYS-
He3		 LTSYS-
HeDIL		 LTSYS-
Cc		 LTSYS-
CcADR		 LTSYS-
CcDIL		 LTSYS-
Ptc
CFM - CONFOCAL MICROSCOPES
   
low temperature CFM, highly modular and flexible
yes
no
no
on request
no
no
yes
   
low temperature CFM, highly modular and flexible
yes
yes
yes
yes
yes
yes
yes
   
low temperature CFM, optimized for transmission measurements
yes
yes
on request
yes
yes
yes
on request
AFM - ATOMIC FORCE MICROSCOPES
   
low temperature AFM, interferometric sensor
yes
yes
on request
yes
yes
yes
yes
   
low temperature AFM, tuning fork sensor
yes
yes
on request
on request
on request
on request
on request
   
low temperature AFM/STM, tuning fork sensor
yes
yes
on request
no
no
no
no
   
low temperature AFM/CFM, tuning fork sensor
yes
no
no
no
no
no
no
MFM - MAGNETIC FORCE MICROSCOPES
   
low temperature MFM, interferometric sensor
yes
yes
no
on request
no
no
no
SNOM - SCANNING NEARFIELD OPTICAL MICROSCOPES
   
fiber based, low temperature SNOM, tuning fork sensor
yes
yes
on request
on request
on request
on request
no
STM - SCANNING TUNNELING MICROSCOPE
   
low temperature STM, highly compact and stable
yes
yes
no
no
no
no
no
CRYOGENIC PROBE STATION
   
ultra stable cryogenic probe station
yes
no
no
yes
no
no
no
   
highly flexible cryogenic probe station
yes
no
no
yes
no
no
no
CUSTOM MEASUREMENT HEADS
 

Cannot find your solution? Ask our application engineers for your custom solutions [request form]


 


 

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