- attoAFM/MFM Ixs
- alignment-free cantilever holder
- PPMS compatibility
- selected applications
The attoAFM Ixs is an ultra-compact atomic force microscope designed particularly for applications at low and ultra low temperature. The instrument works by scanning a sample below a fixed cantilever while measuring its deflection with highest precision using a fiber based optical interferometer. Combined with the ASC500 SPM controller, both contact and non-contact modes are applicable, making the attoAFM Ixs a powerful tool for topographic measurements, force spectroscopy and other imaging modes.
The microscope uses a set of xyz-positioners for coarse positioning of the sample over a range of several mm. Developed particularly for cryogenic applications, the piezo-based scanner provides a scan range of 30 μm x 30 μm at room temperature, and 15 μm x 15 μm at liquid helium temperature. The adjustment of the cantilever is performed outside of the cryostat prior to cooling down the microscope. The exceptional combination of materials allows absolutely stable high resolution imaging of surfaces.
Fields of Application
- alignment-free cantilever holder
- ultra compact, highly rigid MFM head
- highly sensitive interferometric deflection detection
- adjustment of the cantilever outside the cryostats prior to cooling the microscope
- tip exchange in less than 2 minutes
- high spatial resolution imaging
- simultaneous ultra high resolution topographic & magnetic force imaging
- compatible with any commercially available MF probe
- investigation of superconductors
- domain structure studies
- material science
COMPATIBLE COOLING SYSTEMS
- Quantum Design PPMS, see compatibility chart
- any cryostat with bore size >= 1" (25.4 mm)
Quick. Intuitive. Efficient.
AFM tip exchange in less than 2 minutes
attocube's alignment-free cantilever holder is integrated in all AFM microscopes (and respective options, such as MFM, PFM, KPFM, ct-AFM) and allows for quick and inuitive tip exchange and the easy mechanical alignment of the cantilever. The holder features a folding mechanism, which allows the extraction of the cantilever holder for tip exchange without dismounting the AFM head itself.
To exchange the tip, the holder is simply put into an exchange basis with a leveled platform. This enables to easily slide in an out cantilevers, thus minimizing the danger of damaging the costly and valuable tips during handling. The tip itself is held in place by a spring blade, which can be slid open and closed via another clever quick folding mechanism. This way, the tip can be replaced within tens of seconds. During reattachment, a guiding rod automatically centers the cantilever holder. When folding the head back into its initial parking position, the fiber end is perfectly aligned with respect to the cantilever. The desired interference pattern with ideal contrast is thus automatically achieved without any further mechanical alignment.
The new alignment-free cantilever holder is now part of every attocube AFM/MFM, and is compatible with the PointProbe® Plus XY-Alignment Series by Nanosensors.
attocube's alignment-free cantilever holder
attocube introduces its new alignment-free cantilever holder facilitating tip exchange and the mechanical alignment of the cantilever in all AFM/MFM microscopes. The new AFM head features a folding mechanism, which allows to easily extracting the cantilever holder for tip exchange without dismounting the AFM head itself.
PPMS Compatibility Chart
quick overview of compatibilities between
Conductive-Tip AFM Measurement on Ruthenium
In this application, atomic steps on Ruthenium were investigated using
|(Sample and measurement courtesy of V. Da Costa, J.-F. Dayen, B. Doudin, IPCMS-DMONS, CNRS/University of Strasbourg, France)|
Atomically Flat Terraces
Image of atomically flat terraces on a 0.1° canted SrTiO3 surface using a standard attoAFM I. The height difference for each terrace is ~0.39 nm. This demostrates the height resolution that is possible with the attoAFM I. Acquisition time for this 150 x 150 pixel image of size 2 x 2 μm² (13 nm pixel size) was about 15 min.
|(attocube application labs, 2007)|