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ATTODRY500-SPM
confocal microscope and atomic force microscope based on the attoDRY500 platform
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attocube is proud to announce the release of the attoDRY500-SPM family, currently consisting of a confocal (CFM) and an atomic force microscope (AFM). Both microscopes are fully integrated into the attoDRY500 and allow sophisticated measurements in an ultra low vibration, cryogenic environment. A proprietary design allows fast sample (AFM, CFM) and tip (AFM) exchange. Please inquire with our sales office for the implementation of microscopes such as MFM or the tuning fork-based AFM III.
attoDRY500 - CFM
The attoDRY500-CFM is an ultra-stable confocal microscope in free-beam configuration, enabling a wide range of measurements such as classical pump-probe experiments, fluorescence measurements, quantum dot investigations, Raman microscopy, and many more. The microscope can be equipped with a choice of objectives, with numerical apertures (NA) ranging from 0.55 to 0.95. This choice of objectives also includes the new apochromatic objectives which allow higher quality low temperature optical measurements than ever before.
attoDRY500 - AFM
The attoDRY500-AFM is an ultra-stable atomic force microscope with interferometric cantilever deflection detection. While the working principle is based on the attoAFM I, the attoDRY500-AFM has undergone a complete redesign to provide maximum ease of use combined with highest stability and minimal turn-around times. With its self-centering and easily removable microscope head, the attoDRY500-AFM allows sample and tip exchange in a matter of seconds, making it the ideal tool for high throughput measurements in cryogenic conditions.
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attoDRY500 - AFM |
| Temperature Range |
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standard edition |
3.5 .. 350 K |
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| General Specifications |
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sample chamber material |
all non-magnetic |
temperature isolation |
vacuum isolation, radiation shielded |
top loading system |
quick and easy sample exchange (top lid removable) |
vibration isolation |
internal anti-vibration system |
compressor |
variable flow rate technology for lower power consumption and extended life time |
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| CFM Specifications |
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configuration |
confocal microscope with free-beam optics, excitation and collection ports fully adjustable. Microscope head self-supported on microscope housing for rapid sample exchange |
operation modes |
reflection, transmission, fluorescence |
compatible objectives |
all low-temperature and high NA objectives |
excitation source |
400 .. 1500 nm, fiber coupled (see objective description) |
sample positioning |
coarse positioners ANPxyz101 with piezo scanner ANSxy100; coarse range 5 x 5 x 5 mm³ |
sample monitorig |
via CCD camera (optional) |
ASC400 Scan Controller |
for specifications please refer to the attoCONTROL section |
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| AFM Specifications |
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configuration |
cantilever-based atomic force microscope with interferometric deflection detection. Microscope head self-supported on microscope housing for rapid tip and sample exchange |
operation modes |
contact, non-contact, intermittent contact, ct-AFM, MFM, EFM |
compatible cantilevers |
all standard AFM and MFM cantilevers commercially available |
sample positioning |
coarse positioners ANPxyz101 with piezo scanner ANSxy100; coarse range 5 x 5 x 5 mm³ |
sample monitorig |
via CCD camera (optional) |
ASC500 Scan Controller |
for specifications please refer to the attoCONTROL section |
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| Sample vibration level of an attoDRY500 equipped with the /XYZ option measured against a reference platform (heavy optical table). The measurement was conducted at 4 K. |
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| Close-up of the attoDRY500 sample chamber which provides exceptional access for mounting samples to the top of the integrated nanopositioning stage. |
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