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NC-AFM 2010
July 31 - Aug 05, 2010
Kanazawa, Japa

ASC 2010
August 01 - 06, 2010
Washington, D.C., USA

M&M
August 02 - 05, 2010
Portland, USA

ICORS 2010
August 08 - 13, 2010
Boston, USA

Cryogenic Raman measurements have been performed on epitaxially grown graphene, recorded with the attoRAMAN microscope at both room temperature and 4.2 K.

attocube‘s cantilever-based attoMFM Ixs was used inside a PPMS to image Co/Pd dots (50 nm in diameter) at 10 K and various magnetic fields. The magnetic field was applied vertically to the chip surface (“Sample courtesy of Hitachi Global Storage Solutions, San Jose, USA”).